Miryala M., Kechik M.M., Shaari A.H., Baqiah H., Talib Z.A., Kien C.S., Pah L.K., Hashim A., Kamarudin A.N., Abdullah S.N., Karim M.K., Shabdin M.K., Suhaimi N.E.
Murakami M., Chen S.K., Miryala M., Kechik M.M., Lim K.P., Shaari A.H., Ramli A., Baqiah H., Talib Z.A., Kamarudin A.N., Abdullah S.N., Karim M.K.
Ключевые слова: HTS, YBCO, bulk, fabrication, heat treatment, doping, graphene, nanoparticles, X-ray diffraction, lattice parameter, microstructure, grain size, susceptibility, critical temperature
Murakami M., Miryala M., Kechik M.M., Shaari A.H., Baqiah H., Talib Z.A., Kien C.S., Pah L.K., Khalid N.A., Baharuddin N.A., Hashim A.
Ключевые слова: HTS, YBCO, bulk, carbon, nanoscaled effects, nanodoping, fabrication, precipitation methods, resistance, temperature dependence, critical temperature, composition, critical caracteristics, current-voltage characteristics, critical current density, X-ray diffraction, lattice parameter, microstructure, experimental results
Abd-Shukor R., Kechik M.M., Shaari A.H., Baqiah H., Talib Z.A., Kien C.S., Pah L.K., Dihom M.M., Yusuf N.N., Jusoh W.N., Sukor S.I.
Ключевые слова: HTS, YBCO, bulk, doping effect, nanoscaled effects, nanoparticles, microstructure, dielectric properties, X-ray diffraction, phase formation, lattice parameter, grain size, composition, resistive transition, resistivity, temperature dependence, critical temperature, susceptibility, impedance, experimental results
Abd-Shukor R., Kechik M.M., Shaari A.H., Baqiah H., Talib Z.A., Kien C.S., Azis R.S., Dihom M.M., Al-Hada N.M.
Abd-Shukor R., Kechik M.M., Shaari A.H., Baqiah H., Talib Z.A., Kien C.S., Azis R.S., Dihom M.M., Al-Hada N.M.
Kechik M.M., Talib Z.A., Kien C.S., Khalid N.A., Baharuddin N.A., Baqiaha H., Yusufa N.N., Shaaria A.H., Hashimb A.
Ключевые слова: HTS, YBCO, bulk, doping effect, carbon nanotubes, resistive transition, resistivity, temperature dependence, composition, fabrication, critical temperature, critical caracteristics, current-voltage characteristics, critical current density, X-ray diffraction, lattice parameter, microstructure
Abd-Shukor R., Kechik M.M., Shaari A.H., Baqiah H., Talib Z.A., Kien C.S., Azis R.S., Pah L.K., Dihom M.M., Al-Hada N.M.
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